Self-Obsession: How Our Need for Identity Threatens Our Wellbeing

ourprice £14.99

Author Tom Davies
Format Paperback
Publisher Watkins Media Limited
Publication Date 2025-05-27
Pages 184
ISBN-13 9781786789501

In stock

Description

There is one point that contemporary psychology and centuries old Eastern Buddhist and Taoist teachings agree on: if you wish to experience less suffering, you must change the way you see yourself. But what if the change that is needed is to let go of our selves entirely? What does this mean for those of us living in an increasingly self-obsessed and individualistic society? Is our quest for identity actually sabotaging our own wellbeing?In this compassionate and galvanizing book, Dr Tom Davies gently invites you to consider the basic elements that define who you are. In Part One, get to know your self. From the ground up, discover what the self truly is, how it links to identity, and how self-obsession is central to the human condition and the psychological pain that each of us experience. In Part Two, overcome self-obsession. Free yourself from your psychological prison, and learn how to live the peaceful and joyful life that you deserve. With a fresh and lucid style, Dr Tom Davies combines his knowledge of the medical, psychological and the philosophical to bring you real solutions to life’s most challenging problems. Whether you are searching for meaning, or are struggling with stress, anxiety, grief or depression, this perspective will provide you with an empowering new insight that can help you transform your life.

Additional information

Weight 0.202 kg
Dimensions 1.7 × 13.5 × 21.6 cm
Author

Tom Davies

Publisher

Watkins Media Limited

Imprint

Watkins Publishing

Format

Paperback

ISBN-13

9781786789501

Publication Date

2025-05-27

Publication Year

2025

Pages

184

Country of Publication

GB

Language

English

Reviews

There are no reviews yet.

Be the first to review “Self-Obsession: How Our Need for Identity Threatens Our Wellbeing”

Your email address will not be published. Required fields are marked *